Study of Plasma Oscillations in Semi-Conductors During the Shifting of X-Ray Absorption Edges

O. K. Harsh, K, C. M. Shukla, S. P. Godia* and Tapasi Dhar

Department of Post Graduate and Research in Physics, Feroze Gandhi College, Raebareli India.

ABSTRACT:

The shifting of X-ray absorption edges of strontium in various compounds have been calculated by using the Fermi and Plasmon energy shift methods. Our calculated values agree fairly well with the experimentally observed values of Ubgade and Sarode. Present methods also successfully explain the nature of the chemical shifts. Comparison have been made between two methods presented here. It can be seen that Piasmon energy shift method is more reliable as it also explains the multiple plasmon energy shifts. The effect of the geometry on the chemical shift has also been discussed.

KEYWORDS:

Plasma Oscillations; Semi-Conductors

Download this article as: 

Copy the following to cite this article: Harsh O. K, Shukla K. C. M, Godia S. P, Dhar T. Study of Plasma Oscillations in Semi-Conductors During the Shifting of X-Ray Absorption Edges. Orient J Chem 1992;8(3).

Copy the following to cite this URL: Harsh O. K, Shukla K. C. M, Godia S. P, Dhar T. Study of Plasma Oscillations in Semi-Conductors During the Shifting of X-Ray Absorption Edges. Orient J Chem 1992;8(3). Available from: http://www.orientjchem.org/?p=39093