Chemical Bath Deposition of SnS Thin Films: AFM, EDAX and UV-Visible Characterization

Anuar Kassim¹*, Ho Soon Min¹, Atan Sharif¹, Jelas Haron¹ and Saravanan Nagalingam²

¹Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, 43400 Serdang, Selangor (Malaysia). ²Faculty of Science, Universiti Tunku Abdul Rahman, 31900 Kampar, Perak (Malaysia).

ABSTRACT:

In this study, chemical bath deposition has been used to prepare tin sulfide thin films on microscope glass slides from acidic aqueous solution. The effect of bath temperature on the properties of thin films was investigated using atomic force microscopy, energy dispersive X-ray analysis and UVVisible spectrophotometer. Atomic force microscopy image for the films deposited at 80 °C revealed that all grains uniformly distributed over the surface of substrate indicated well defined growth of SnS material. Optical absorption showed the presence of direct transition and band gap energy decreased from 1.5 to 1.2 eV with the increased of bath temperature from 40 to 80 °C.

KEYWORDS:

Tin sulphide; Atomic force microscopy; Thin films; Surface roughness; Thickness

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Copy the following to cite this article: Kassim A, Min H. S, Sharif A, Haron J, Nagalingam S. Chemical Bath Deposition of SnS Thin Films: AFM, EDAX and UV-Visible Characterization. Orient J Chem 2011;27(4).

Copy the following to cite this URL: Kassim A, Min H. S, Sharif A, Haron J, Nagalingam S. Chemical Bath Deposition of SnS Thin Films: AFM, EDAX and UV-Visible Characterization. Available from: http://www.orientjchem.org/?p=11772